The anelastic spectroscopy measures the strain response to applied stress and is the mechanical analogue to the dielectric spectroscopy (polarization…Read More
Angle-resolved photoemission spectroscopy (ARPES) probes the electronic band structure of ordered solids near the Fermi level through the photoelectric effect.…Read More
Fourier transform infrared (FTIR) spectroscopy is considered among the effective techniques to study and understand the chemical and surface chemistry…Read More
The inverse photoemission spectroscopy (IPES) allows to investigate the electronic properties of empty states of solids, surfaces, adsorbate-gas-solid interfaces and…Read More
Photoluminescence (PL) is the most common characterization technique for materials used for photovoltaic and light-emitting applications. Incident photons are absorbed…Read More
Raman Spectroscopy is a non-destructive chemical analysis technique that provides detailed information about chemical structure, phase and polymorphism, crystallinity and…Read More
The spectral photoconductivity is a powerful tool for measuring the bandgap energy and photoelectronic inter-band transitions in semiconductors, with the…Read More
The spectrally resolved photoemission is a tool for measuring work function of materials and electron affinity of semiconductors. The technique…Read More
Total X-rays Fluorescence (TXRF) is an ultra-sensitive surface elemental analysis technique. TXRF differs from other XRF techniques by its geometry:…Read More
UV-VIS spectroscopy is a powerful analytical technique to determine the optical properties (transmittance, reflectance and absorbance) of liquids and solids.…Read More
X-ray photoelectron spectroscopy (XPS) studies the chemical properties of solids through the photoelectric effect. In a XPS experiment a solid…Read More
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