The spectrally resolved photoemission is a tool for measuring work function of materials and electron affinity of semiconductors. The technique allows measuring the total photoemission current as a function of photon energy, as well as the external responsivity and quantum efficiency.
It is based on the measurement of the emitted photocurrent, collected by applying an electric field on the device under test and induced by the interaction with a modulated and monochromatic radiation. The electronic chain for this kind of measurements is particularly sensitive and is made up by a mechanical chopper, a trans-impedance amplifier, a lock-in amplifier, and a voltage source.
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