Total X-rays Fluorescence (TXRF) is an ultra-sensitive surface elemental analysis technique. TXRF differs from other XRF techniques by its geometry: an incident beam of X-rays impinges upon a flat sample at angles below the critical angle of total external reflection, generally less than 1°. This grazing angle geometry allows the system to produce a relatively high signal-to-noise ratio and increase the surface sensitivity. The reflection of most of the excitation beam photons from the surface are collected on a detector. The software data analysis permits to identify the species on surface. It is possible to perform measurements on bulk, nanostructured and thin film samples.
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