Atomic force microscopy (AFM)

Atomic force microscopy (AFM) is a powerful imaging technique that, by scanning a sharp tip (typical tip diameter 5–10 nm) over a surface, can produce topographical images on the nanoscale.  
It is versatile because an AF microscope can image in three-dimensional topography and it also provides various types of surface measurements to the needs of scientists and engineers. It is powerful because it generates images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation.

AFM Quesant AFM@XRaySpectroscopy AFM@Biotech AFM@Nanospectroscopy