The AFM Quesant Resolver 250 system allows morphology investigation of surfaces thanks to a non-destructive, large sample scanning capability. In particular, this system generates topographic images of the surface investigated with atomic resolution and determines roughness, grain size, and features on the nanoscale.
The system is equipped with a video microscope with a 90° top down view that allows to quickly find sample features and align the probe over them. A manual X-Y translation stage can handle up to 6" diameter samples.
The device uses a proprietary scanning technique called WaveMode (an intermittent contact mode that allows scanning frequencies up to 20 Hz), that provide a significant reduction in acquisition time.
The system is equipped with a video microscope with a 90° top down view that allows to quickly find sample features and align the probe over them. A manual X-Y translation stage can handle up to 6" diameter samples.
The device uses a proprietary scanning technique called WaveMode (an intermittent contact mode that allows scanning frequencies up to 20 Hz), that provide a significant reduction in acquisition time.
TECHNICAL SPECIFICATIONS
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X-Y Translation Stage: Manual;
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Z Translation Stage: Motorized and automated;
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Maximum Image (Data) Resolution: 1024 x1024 pixels;
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Maximum scanning area: 10 x 10 µm2 a 80x80 µm2;
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Lateral resolution: 1 nm;
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Vertical resolution: 0.1 nm.
AVAILABLE TECHNIQUES
- Scanning Modes: Intermittent Contact AFM (WaveMode™)
SAMPLES (substrates)
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Maximum Sample Size: 6" x 6"/ 150mm x 150mm2
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Maximum Sample Heights: 2.5"/ 67mm.
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