The photocurrent generated by semiconductors irradiated by an x-ray beam can be a very useful tool for characterizing the materials’ sensitivity to x-ray and response to radiation dose and/or dose-rate. The tool is particularly significant also for evaluating the mobility-lifetime of the semiconductor’s photogenerated charge carriers, that is a measure of its transport capability.
It is based on the measurement of the photocurrent, collected by applying an electric field on the device under test and induced by the interaction with a focusable x-ray beam. The electronic chain for this kind of measurements is particularly sensitive and is made up by a mechanical chopper for x-rays, a trans-impedance amplifier, a lock-in amplifier, and a voltage source.
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