PIFS is a photon in - photon out technique, exploiting characteristic "secondary" (or fluorescent) photons emitted from a material illuminated by X-rays.
This technique is available at the GasPhase beamline in two different variants that exploit bright, coherent, energy-tunable and monochromatic light form the Elettra synchrotron radiation source.
- X-ray Emission Spectroscopy (XES)
Thanks to its atomic sensitivity XES is a powerful analytical tool. It provides both site and element specificity, and it is extremely useful in investigating the electronic structure of molecules.The position of emission lines reflects small changes in occupied energy levels, whereas their intensity as a function of incident photon energy probes unoccupied molecular orbitals.
- Vis-UV Fluorescence Spectroscopy
Analysis of vis-UV fluorescence allows to identify molecular and atomic photofragments resulting from relaxation dynamics of inner shell primary excitations. It allows thus to disentangle different relaxation mechanisms and obtain valuable informations on the nature of inner schell excitations.
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