Microscopy, diffraction and reflectometry

Microscopy, diffraction and reflectometry

$X-Ray diffraction (XRD)$

X-Ray diffraction (XRD)
X-ray diffraction (XRD) is a non invasive technique used for determining the atomic and molecular structure of a material. It… Read More
Atomic force microscopy (AFM)
Atomic force microscopy (AFM) is a powerful imaging technique that, by scanning a sharp tip (typical tip diameter 5–10 nm)… Read More
Energy dispersive X-ray reflection (EDXR)
X-Ray Reflectometry (XRR) is a highly sensitive surface analytical technique used in chemistry, physics and materials science to characterize surfaces,… Read More
$Energy dispersive X-ray diffraction (EDXD)$

Energy dispersive X-ray diffraction (EDXD)
Energy dispersive X-ray spectroscopy is an analytical technique for the characterization of materials: it produces qualitative results on the elemental… Read More
$Low energy electron diffraction (LEED)$

Low energy electron diffraction (LEED)
Low Energy Electron Diffraction (LEED) is used for the study of the surface structure of ordered materials. In a LEED… Read More
$Reflection high-energy electron diffraction (RHEED)$

Reflection high-energy electron diffraction (RHEED)
The reflection high-energy electron diffraction (RHEED) is a diffraction technique that applies a variable high energy electron beam, of a… Read More
Scanning Near-field Optical microscopy (SNOM)
The facility of Scanning Near-field Optical Microscopy (SNOM) allows to observe localized optical structures at the surface or in the… Read More
Scanning tunnelling microscopy (STM)
Scanning tunneling microscopy (STM) is a technique that allows the study of materials surface with a lateral resolution reaching the… Read More
$Photoelectron diffraction (PED)$

Photoelectron diffraction (PED)
Photoelectron diffraction (PED) is an advanced application of XPS that is used to determine structural properties of solids, such as… Read More

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