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Antonio Cricenti -
Marco Luce -
Marco Ortenzi -
David Becerril - Borsista
Stefano Bellucci (INFN) - Associato ISM
Research Activities
The activity is divided into the studies of samples of materials and biological science, and clean semiconductor/metal surfaces and the development of prototype.
In details:
As for local probe scanning microscopy, all the instruments are STM-AFM-SNOM prototypes developed in the institute, that can observe the same area of the sample in different operating modes (contact, non-contact, friction or phase shift mode). In particular, the SNOM can use different optical set-ups (tip lighting, tip collection or lighting / collection modes) optimized to adapt to specific experimental needs.
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Reflectivity of cancer cells at various infrared wavelengths
Localized internal photoemission, reflectance, transmission, fluorescence can be performed in the UV-IR range (lambda 0.4-10 microns). Any type of sample can be observed in a range from a few nm to half a millimeter with chemical sensitivity as well as topographical.
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Measurement of the Schottky barrier in the Pt / n-GaP system by means of internal photoemission located in different points of the sample
Angular resolved photoelectron spectroscopy (ARUPS) is a surface-sensitive quantitative spectroscopic technique that measures the energy of the emitted electrons and their emission angle and, consequently, the information of the vector k. The spectra are obtained by irradiating a material with a beam of UV rays (20-40 eV) and simultaneously measuring the number of electrons with a certain kinetic energy which emerges from the last layers (0-10 nm) of the analyzed material.
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Example of photoemission spectra as a function of the emission angle for the surface Si (110) -Sb (2x3)
Auger and XPS techniques resolved angularly measure the elemental composition of a few parts per thousand of materials and are obtained by irradiating a material with an electron beam (Auger) or X-rays (XPS) and simultaneously measuring the kinetic energy and the number of electrons at any emission angle, in order to be more sensitive to the surface or bulk.
Relevant Publications
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Bonfigli, F.; Capotondi, F.; Cricenti, A., Giannessi, L.; Kiskinova, M.; Luce, M.; Mahne, N., Manfredda, M.; Montereali, R.; Nichelatti, E.; Pedersoli, E.; Raimondi, L.; Vincenti, M.A.; Zangrando, M.; (2019)
“Imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for XFEL beam monitoring"
Il Nuovo Cimento C
“Imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for XFEL beam monitoring"
Il Nuovo Cimento C
Callari, Giuseppina; Mencattini, Arianna; Casti, Paola, Comes, Maria Colomba; Di Giuseppe, Davide; Di Natale, Corrado; Sammarco, Innocenzo; Pietroiusti, Antonio; Magrini, Andrea; Lesci, Isidoro Giorgio; Luce, Marco; Cricenti, Antonio; Martinelli, Eugenio (2019)
“The Influence of Uncertainty Contributions on Deep Learning Architectures in Vision-Based Evaluation Systems in IEEE transactions on instrumentation and measurement"
“The Influence of Uncertainty Contributions on Deep Learning Architectures in Vision-Based Evaluation Systems in IEEE transactions on instrumentation and measurement"
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Instrumentation
AFM@Nanospectroscopy SNOM XPS@Nanospectroscopy ARUPS
Collaborations
- UNAM Messico,
- Fondazione Santa Lucia,
- Università di Liverpool,
- Dipartimento di Fisica, Ingegneria Elettronica e Biomedicina e Prevenzione dell’Università Roma Tor Vergata,
- INFN,
- ENEA,
- Dipartimento di Fisica Università di Roma La Sapienza e Roma3,
- Vinca Institute Belgrad.