Scientific Instruments and Devices


Since the days of pioneering experiments at ADONE in Frascati in the 80s, ISM gained experience in the design and construction of scientific instruments for synchrotron radiation. ISM research groups designed and manage three CNR beamlines (VUV, GasPhase, Circular polarization) at the synchrotron radiation source ELETTRA (Trieste). The ISM microscopy research group developed state of the art AFM and SNOM.

In the institute the most important facilities for a full microscopic characterization of materials and for advanced experiments in the field of soft, hard and low density matter are present.

Facilities based on absorption spectroscopy:

  • Micro-Raman spectrometer – Raman imaging
  • Ultrafast transient absorption spectroscopy – femtosecond pump-probe spectroscopy of liquids and solids
  • Time Resolved PhotoLuminescence via Time Correlated Single Photon counting – electronic properties of solids and liquids (in collaboration with IMM-CNR)
  • Soft X-Ray absorption spectroscopy – local electronic properties of solids and interfaces (VUV, CiPo beamlines) and low density matter (Gas Phase beamline)
  • X-Ray Magnetic Circular Dichroism – local magnetic properties (CiPo beamline)
  • VUV and Soft X-Ray mass spectrometry experiments in low density matter (Gas Phase, CiPo beamlines)

Facilities based on photoelectron spectroscopy:

  • X-Ray Photoemission Spectroscopy – local electronic properties of surface and interfaces with lab source and synchrotron radiation (VUV beamline)
  • Angle Resolved Photoelectron Spectroscopy – band dispersion in solids and interfaces (VUV beamline)
  • PhotoElectron Spectroscopy – Electron Coincidence in the VUV – Soft X-Ray of free molecules, clusters (Gas Phase beamline)
  • PhotoElectron Circular Dichroism in the VUV – Soft X-Ray – electronic properties of chiral molecules (CiPo beamline)

Thin films and surface X-Ray diffraction facilities:

  • Grazing Incidence X-Ray diffraction
  • X-Ray reflectivity
  • Energy Dispersive X-Ray diffraction

Facilities based on microscopy:

  • Scanning Tunneling Microscopy – atomic scale topography and density of state spectroscopy on surfaces
  • Atomic Force Microscopy – surface imaging and nano-manipulation
  • Scanning Near-field Optical Microscope – imaging beyond far field resolution limit

Facilities based on magnetometry:

  • Superconducting Quantum Interference Device magnetometer – highest detection sensitivity for magnetic material characterization