Infrastructures


 

1. ADES 450 
Description: UPS, XPS and Auger spectrometer for angular revolved study
Site: ARTOV
Task: MD.P06.006
Contact: Antonio Cricenti
2. UHV thin film deposition system 
Description: UHV deposition system for production thin film. The system has got two chambers, one for film deposition and one fast entry lock.
Site: MLIB
Contact: Anna Maria Paoletti
3. Thin Film XR diffractometer 
Description: Seifert XRD 3003TT
Site: MLIB
Contact: Patrizia Imperatori
4. XR powder diffractometer 
Description: Seifert XRD 3003P
Site: MLIB
Contact: Patrizia Imperatori
5. EDRX 
Description: Energy-Dispersive X-ray Diffractometer
Site: ARTOV
Task: MD.P03.006
Contact: Valerio Rossi Albertini
6. KSV 2000 
Description: Langmuir-Blodgett instrument for unsupervised deposition of ordered multilayer LB-films on large solid substrates.
Site: MLIB
Contact: Aldo Capobianchi
7. SAMOS Laboratory 
Description: UHV chamber for surface studies
Site: ARTOV
Task: MD.P06.005
Contact: Giorgio Contini
8. Circular Polarized Beamline 
Description: Magnetic circular dichroism in absorption spectroscopy; X-ray photoemission spectroscopy; photoemission spectroscopy from UV to soft X-ray; spin-resolved photoemission; angle-resolved photoemission with high energy resolution.
Site: Trieste
Task: MD.P06.005
Contact: Nicola Zema
9. VUV Beamline 
Description: High resolution photoemission on core level and valence band; Band and Fermi Surface mapping by angle-resolved photoemission; Absorption in the VUV and soft X-ray range; Photoelectron Diffraction; energy range: 20 eV − 800 eV
Site: Trieste
Task: MD.P04.004
Contact: Carlo Carbone
10. MBE 
Description: Molecular Beam Epitaxy apparatus for the growth of: MnxGe1-x diluted magnetic semiconductors at various Mn concentrations, Ferromagnetic Mn5Ge3 compound, epitaxial layers and/or dots of Ge/Si, SiGe/Si doped with
Site: ARTOV
Task: MD.P04.004
Contact: Paola De Padova
11. PDL 
Description: Laser eccimeri KrF (246nm), 300mJ, 50Hz – Camera deposizione HV
Site: MLIB
Contact: Elisabetta Agostinelli
12. SPM 
Description: Scanning Probe Microscopy Laboratory
Site: ARTOV
Task: MD.P06.006
Contact: Antonio Cricenti
13. EPR Spectrometer 
Description: Varian E-109 Spectrometer, Hmax 1.5 T f= 9.1 and 35 GHz T= 4-300 K
Site: MLIB
Contact: Donato Attanasio
14. FT-IR Spectrometer 
Description: IR-Prestige-21 Shimadzu; wavelength range 7.800 – 350 cm-1;
Site: MLIB
Contact: Elvira Maria Bauer
15. UV-Vis. Spectrometer 
Description: Spectrophotometer 950 Perkin-Elmer; wavelength range 175 – 3300 nm; UV/Vis resolution 0.05 – 5.00 nm; Nir resolution 0.2 – 20 nm
Site: MLIB
Contact: Elvira Maria Bauer
16. SQUID RF  
Description: Hmax 5.5 T; T= 2-300K
Site: MLIB
Contact: Alberto Maria Testa
17. AC-susceptometer 
Description: T=4-300K; f=10Hz-10kHz
Site: MLIB
Contact: Dino Fiorani
18. VSM 
Description: Vibrating Sample Magnetometer (VMS); Hmax 2T; T=70-300K
Site: MLIB
Contact: Alberto Maria Testa